Area sensors based on CCD or CMOS are at the heart of many high-precision image processing systems. However, the cover glass installed at the factory can significantly limit the performance of the sensor in certain applications. With our specialized cover glass removal, we optimize the optical properties of the sensor and enable higher light sensitivity, improved spectral transmission and minimized reflections—essential for research, industry and science.

Why remove the cover glass from area sensors?

The cover glass originally serves as a protective layer for the sensor. However, in many applications it can cause unwanted interference, reflections or spectral limitations. Especially in areas where maximum quantum efficiency, highest contrast fidelity or exact spectral detection is required, a sensor without cover glass offers clear advantages:

Increased light sensitivity

Removing the cover glass ensures more direct photon detection, allowing more light to reach the sensor pixels and increasing the signal strength.

Optimized spectral transmission

Transmission is improved, particularly in the UV and SWIR range, as there is no longer any absorption or refraction by the cover glass.

No disturbing reflections or interference

The reduction of reflections can significantly increase the signal-to-noise ratio, especially for high-precision measurements, for example in astronomical imaging or fluorescence microscopy.

Direct adaptation of special filters

Customized filters can be placed directly on the sensor without a cover glass, for example to specifically block or amplify certain wavelength ranges.

In addition to cover glass removal, Eureca also offers the application of filters as a service. Furthermore, a UV coating can also be applied to a de-windowed sensor in order to extend the spectral range.

Typical applications for area sensors without cover glass

Astronomy & spectroscopy

Maximum sensitivity in the UV and NIR range for high-precision imaging of celestial bodies or spectral analysis.

Scientific imaging & microscopy

Improved detection of fluorescence signals or extremely weak light sources.

Industrial inspection & quality control

Higher contrasts and more detailed defect detection in semiconductor processes, medical technology or material testing.

Hyperspectral imaging

Optimization of sensor characteristics for multispectral or hyperspectral applications by removing spectral artefacts.

Precise and residue-free removal of the cover glass

Our controlled removal method guarantees that the cover glass is removed from the sensor without mechanical or thermal stress. As a result, the pixel structure remains unchanged and the full performance of the sensor is retained.

• all sensors of the ICX series from Sony (e. g. ICX285AL)
• sensors of the IMX series from Sony
  • Pregius and STARVIS generations, including the latest Pregius S generation (e. g. IMX174, IMX250, IMX304, IMX421, IMX540)
  • latest InGaAs generation (e. g. IMX990)
• OnSemi: CMV4000, Python1300/5000, AR0521
• e2V: EV76C570, EV76C560ABT
• SiOnyx: XQE-0920, XQE-1310
• GPixel: Gsense2020, GMAX3265

Are you interested in a customized solution? Contact us for a personal consultation on cover glass removal and sensor optimization!

Do you use CCD/CMOS linear sensors or SWIR detectors instead of area sensors? We also have suitable processes for cover glass removal in our program.