MenuMENU

Basic Seminar

In the basic seminar, the structure, function and resulting properties of CCD and CMOS sensors are explained in detail. In addition to the differences in the architectures and the physical limits, various measurement methods for characterizing image sensors are also covered.

Topics at a glance

  • Formation of bands in semiconductors
  • Photodiode and pixel structure
  • Charge transfer between individual pixels
  • Standard CCD sensor
  • Full-frame, interline and other sensor types
  • Back-side thinning and Lumogen coating
  • Blooming and Smearing
  • CMOS image sensors
  • Noise sources: Fixed pattern noise, readout noise, KTC noise, 1/f noise, shot noise
  • Photon transfer
  • Dynamic range, signal-to-noise ratio and resolution

Here you can easily ask a question or inquiry about our products:

Product inquiry

Request for:


Last update: 2026-13-03