In 2025, Eureca will continue to organize regular seminars on optoelectronic components—essential components for a wide range of modern applications. Our events are aimed at developers and users, whom we introduce to the properties and limitations of these highly developed components. In addition, purchasers and sales staff learn how to correctly apply important technical terms and working methods in their daily work with these components.

Our seminar programs

Basic seminar

In the basic seminar, the structure, function and resulting properties of CCD and CMOS sensors are explained in detail. In addition to the differences in the architectures and the physical limits, various measurement methods for characterizing image sensors are also covered.

Topics at a glance

• Formation of bands in semiconductors
• Photodiode and pixel structure
• Charge transfer between individual pixels
• Standard CCD sensor
• Full-frame, interline and other sensor types
• Back-side thinning and Lumogen coating
• Blooming and Smearing
• CMOS image sensors
• Noise sources: Fixed pattern noise, readout noise, KTC noise, 1/f noise, shot noise
• Photon transfer
• Dynamic range, signal-to-noise ratio and resolution

Extension seminars

Building on the basic seminar, our advanced seminars delve deeper into more advanced topics relating to the use of CCD/CMOS image sensors. After a brief review of the basics, the focus is on the following key topics—always rounded off by an open discussion round in which your questions are answered.

Extension seminar »From photon to image«

How is a precise image created from light? The seminar deals with pixels, sensitivity and noise, shows the influence of AI on image quality and clarifies the difference between »beautiful« and »correct«. Simulations and live demos are used to analyze optimal image quality in a practical way.

• Pixel, sensitivity and ISO values
• Noise sources and their properties
• Artificial intelligence: the difference between a »beautiful« and a »correct« image
• Simulations to determine the required image quality
• Live simulation of images under different conditions

Extension seminar »From application to camera system«

Resolution, contrast and parameter space determine the image quality. FOV, WD and SD set limits for object size and details. Factors such as albedo, surface and movement require precise adjustments to lighting and camera. SNR, focal length and aperture optimize measurement accuracy for the best results.

Objectives

• Resolution and contrast

Parameter space

• Maximum object size (FOV)
• Minimum structure size to be detected (SD)
• Minimum and maximum object distance (WD)
• Positioning accuracy of the object (in addition to the FOV)
• Speed of movement of the object, if applicable (in addition to the SD)
• Color, albedo and surface of the object
• Color, albedo and surface of the background
• Minimum contrast or minimum SN
• Desired measured variables:
  • Albedo (reflectivity, brightness, color
  • Geometry (dimensions)
• Minimum accuracy of the measured variables:
  • Deviation in %
  • Deviation in mm

Conversion into electro-optical parameters

• SNR → Full Well
• FOV + WD → Focal length
• Focal length → SD (Sampling Distance)
• SD and motion blur → Exposure time
• Full Well and exposure time → Photon flux
• Ambient brightness → Luminance
• Luminance and photon flux → Aperture
• Aperture → Depth of field
• Distortion, MTF etc.

Further topics

• Illumination options (bright field, dark field, incident or transmitted light)
• Lens, sensor and camera selection

Extension seminar »Measurement methods«

Photon transfer

From sensor analysis to optical resolution—focus on key image processing parameters. The photon transfer method provides essential measured values such as conversion gain, full well and read noise. The Siemens star helps to assess resolution and contrast. The quantum efficiency shows how efficiently a sensor processes light. Practical examples and a live demo with the e9u-LSDM-TCD1304 make the concepts tangible.

1. Background and mathematical principles
2. Measurement results: CG, FW, RN
3. Sources of error
4. Recognizing electronic
   • Missing Codes
   • Low passes
   • High passes
5. Live execution of a PTC using the example of the modified e9u-LSDM-TCD1304

Additional seminar »Photography in practice«

New to the program is a one-day seminar dedicated specifically to image capture techniques. This seminar is aimed not only at our customers from research and industry, but also at ambitious professional and prosumer photographers.

Planned topics:

From photon to image

• Structure and function of a sensor
• Noise sources and their characteristics
• Bayerpattern and X-Trans

Belichtung

• Sensitivity, ISO values and pixel sizes
• Over- and underexposure
• The exposure triangle: motion blur, depth of field, noise
  → Practice tips

Resolution

• MTF, including test shots with Siemens star
• Good and bad blur, moiré effects
• Diffraction blur and aperture
• Depth of field, entrance and exit pupil
  → Practice tips

Illumination and reflectivity

• Law of distance
• Gloss and mattness
• Directional reflection and the law of reflection
• Diffuse reflection and Lambert's law of radiation
• Color, albedo, remission and contrast
• Rayleigh scattering (haze, sky blue)
• Mie scattering (whitemist filter)
• Tyndall effect (fog)
• Geometric scattering (blackmist filter)
• Diffraction (hair in backlight)
• Polarization and Brewster angle
• Polarization of the sky

Filter

• Neutral density filter (to control motion blur)
• Polarization filter (reduction of reflections, deep blue sky)
• White and blackmist filter (soft focus)
• Color filters (black and white photography)
  → Practice tips

Geometric parameters

• Focal level
• Scheimpflug principle with tilt lenses, including practical test
• Depth of field, including practical test
• Brewster angle, including practical test
  → Practice tips

Image enhancement

• Using AI: the difference between a »beautiful« and a »correct« image

Our seminars offer you in-depth specialist knowledge, practical examples and interactive discussions—everything to prepare you optimally for the use of state-of-the-art optoelectronic components. We look forward to welcoming you to our events!

The exact dates and venues will be announced here shortly. Please contact us if you are interested or follow us on LinkedIn, to stay up to date.