Eureca regularly organizes seminars about optoelectronic components, which are a fundamental element of a variety of applications. In the seminars, aimed at developers and users, the characteristics and limitations of image sensors are shown. Furthermore, the assessment of important sensor characteristics and methods for their measurement are discussed.

But also for buyers and salespeople the contents of the seminars are of interest for the daily use of these very specialized and sophisticated components and in order to use important technical terms and procedures correctly.


This seminar explains in detail the set-up of CCD and CMOS sensors and their resulting characteristics. The differences in architecture and physical limitations will be illustrated. Additionally, we will deal with measurement techniques for the characterisation of image sensors and the interpretation of specifications on data sheets.

  • development of bands in semiconductors
  • structure of photodiodes and pixels
  • charge transfer between single pixels
  • standard CCD sensors
  • full frame sensor, interline sensor
  • full frame sensor, interline sensor
  • blooming, smearing
  • CMOS image sensors
  • noise sources (fixed pattern noise, read noise, KTC noise, 1/f noise, shot noise)
  • photon transfer
  • dynamics, signal-to-noise ratio, resolution


Advanced course

This seminar is based on our basic seminar and deals with advanced topics that are to be considered when using CCD/CMOS image sensors. After a brief refresher of the topics from the basic seminar, the topics are as described below. The seminar is concluded with an open discussion about the topics of the seminar and your questions.

  • Noise of image sensors (temporal sources of noise and their properties including sample images and videos)
    • Noise (Johnson, Read out, Shot, KTC)
    • Dark current and resulting temporal noise
    • 1/f and fixed pattern noise, including sample images and videos
    • Offset, Gain, Linearity
    • Dark current
  • Corrections (Measurement of the Fixed Pattern Noise as well as detection via photon transfer)
    • Recognition by FFT, preparation of the measured values ​​and estimation of the accuracy
    • Corrections (two-point, piecewise linear, polynomial)
    • other image artifacts including sample pictures and videos
    • Digitization noise, Moire, Bayer Pattern
    • Temporal and spatial lowpasses
    • White-noise dithering including sample pictures and videos
    • Optimal ratio of read noise to the depth of digitization
    • Measures to reduce the depth of digitization
    • Examples of information gain
  • Dynamic range (High Dynamic Range)
    • Definitions
    • Intra- and interscene
    • Methods of realization
    • Problems and artifacts
  • Comparison of specifications (parameters)
    • Which parameters are universal for comparing sensors or cameras? (Which common problems and traps exist?)
    • Data sheet interpretation
    • How to extract universal parameters that are not explicitly named?

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Last update: 2020-30-01